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Your search returned 19 records. Click on the hyperlinks to view further details of Titles.. |
Magazine Name : Ieee Transactions On Electron Devices
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Year : 1998 Volume number : 45 Issue: 10 |
Generator Of Ultrashort Optical Pulses For Time Divison Multiplexing
(Article)
Subject:
Distributed Feedback Lasers
,
Electrooptic
,
Integrated Optoelectronics
,
Monolithic Integration
Author:
Jaume
Dellunde
M. C.
Torrent
Joaquin
Sancho-Bru
page:
2122
-
2130
High Efficiency Polycrystalline Silicon Solar Cells Using Low Temperature Pecvd Process
(Article)
Subject:
Gettering
,
High Efficiency
,
Passivation
Author:
Hussam Eldin A.
Elgamel
page:
2131
-
2138
A Comparative Analysis Of The Dynamic Behavior Of Btg/Soi Mosfet'S And Circuits With Distriuted Body Resistance
(Article)
Subject:
Comparative Study
,
Circuit
,
Distributed
Author:
Glenn O.
Workman
Jerry G.
Fossum
page:
2138
-
2145
A Thorough Investigation Of The Degradation Induced By Hot-Carrier Injection In Deep Submicron N-And P-Channel Partially And Fully Depleted
(Article)
Subject:
Device Lifetime
,
Hot-Carrier Effect
,
Soi Mosfet
Author:
Shing-Hwa
Renn
Christing
Raynaud
Francis
Balestra
page:
2146
-
2152
Self-Aligned Control Of Threshold Voltages In Sub-0.2- Mosfet'S
(Article)
Subject:
Ion Implantation
,
Mosfets
,
Semiconductor Devices
,
Simulation
Author:
Hajime
Kurata
Toshihiro
Sugii
page:
2161
-
2166
A Compact Pre-And Post-Stress I-V Model For Submicrometer Buried-Channel Pmosfet'S
(Article)
Subject:
Bc Mosfet'S
,
Bidirectional Model
,
Hot-Carrier-Induced Degradation
Author:
Chwan-Gwo
Chyau
Sheng-Lyang
Jang
page:
2167
-
2178
Improvement Of The Reliability Of Amorphous Silicon Transistors By Conduction-Band Tail Width Reduction
(Article)
Subject:
Amorphous Silicon
,
Amorphous Sitability
,
Energy Band Tails
Author:
Serag M.
Gadelrab
Savvas G.
Chamberlain
page:
2179
-
2186
A Unified Equilibrium Treatment Of Modulation Doped Heterojunctions And Grossly Asymmetric Homojunctions And Its Application To Modfet Design
(Article)
Subject:
Analytical Model
,
Asymmetric Homojunction
,
Space-Charge Layer
Author:
Shreepad
Karmalkar
page:
2187
-
2195
Negative Capacitance Effect In Semiconductor Devices
(Article)
Subject:
Capacitance
,
Semiconductor Devices
Author:
Maxim
Ershov
M.
Buchanan
Andrew K.
Jonscher
page:
2196
-
2206
Noise Modeling In Mesfet And Hemt Mixers Using A Uniform Noisy Line Model
(Article)
Subject:
Conversion Matrix
,
Fet Mixer
,
Nonlinear Device
Author:
Francois
Danneville
Gilles
Dambrine
Alain
Cappy
page:
2207
-
2212
Quantum Effects Upon Drain Current In A Biased Mosfet
(Article)
Subject:
Quantum Effect
,
Drain Current
,
Mosfet
Author:
Brian K.
Ip
John R.
Brews
page:
2213
-
2221
Electrothermal Simulations In Punchthrough And Nonpunchthrough Igbt'S
(Article)
Subject:
Electrothermal Simulation
,
Igbt
,
Pt
,
Short Circuit
Author:
S
Pendharkar
M
Trivedi
K
Shenai
page:
2222
-
2231
Effect Of Diamond-Like Carbon Coating On The Emission Characteristics Of Molybdenum Field Emitter Arrays
(Article)
Subject:
Emission Current
,
Emission Stability
,
Hydrogen-Free Dlc
Author:
Jae Ho
Jung
Byeong Kwon
Ju
Hoon
Kim
page:
2232
-
2237
A Physical Simulation Model For Field Emission Triode
(Article)
Subject:
Field Effect Transistor
,
Fowler
,
Simulation Model
Author:
Chih-Wen
Lu
Chung Len
Lee
page:
2238
-
2244
An Analytical Grain-Barrier Height Model And Its Characterization For Intrinsic Poly-Si Thin-Film Transistor
(Article)
Subject:
Cb States
,
Grain-Barrier Height
,
Grain Size
,
Intrinsic
Author:
Hsin-Li
Chen
Chung-Yuan
Wu
page:
2245
-
2246
Tunnelling Transport In Al-N-Gasb Schottky Diodes
(Article)
Subject:
Gallium Antimonide
,
Interface Modification
,
Schottky-Diode
Author:
A.
Subekti
T. L.
Tansley
E. M.
Goldys
page:
2247
-
2248
A Model For The Drain Current Of Deep Submicrometer Mosfet'S Including Electron-Velocity Overshoot
(Article)
Subject:
Mos Devices
,
Semiconductor Devices
Author:
J B
Roldan
F
Gamiz
J. E.
Carceller
page:
2249
-
2250
Lateral Igbt In Thin Sol For High Voltage, High Speed Power Ic
(Article)
Subject:
Breakdown Voltage
,
Lateral Device
,
Voltage Drops
Author:
Ying-Keung
Leung
Amit K.
Paul
S Simon
Wong
page:
2251
-
2254
A Hierarchical Reliability Analysis For Circuit Design Evaluation
(Article)
Subject:
Electromigration
,
Integrated Circuit
,
Integrated Circuit Reliability
Author:
S. P.
Riege
C. V.
Thompson
J. J.
Clement
page:
2254
-
2257
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